National Repository of Grey Literature 4 records found  Search took 0.00 seconds. 
Evaluation of machine elements surface topography by optical profilometer
Vrána, Jakub ; Křupka, Ivan (referee) ; Šperka, Petr (advisor)
This thesis deals with the issue of surface texture topography of engineering parts. Research provides general view of surface texture topography evaluation and puts the aforementioned into the context of international standards. In the practical part of this thesis, an experiment is implemented. With help of optical interferometer, parameters are measured and their robustness is evaluated. In the conclusion part of this thesis, acquired information are evaluated and resumed.
Workstation for optical interferometry
Blecha, Martin ; Honec, Peter (referee) ; Janáková, Ilona (advisor)
This thesis is specialized on composition of workplace for experiments flowing from optical interferometry. Here are described laboratory exercise servant for demonstration basic principles of interferometry. In more details is described method measurement of height profile objects with method white light interferometry.
Evaluation of machine elements surface topography by optical profilometer
Vrána, Jakub ; Křupka, Ivan (referee) ; Šperka, Petr (advisor)
This thesis deals with the issue of surface texture topography of engineering parts. Research provides general view of surface texture topography evaluation and puts the aforementioned into the context of international standards. In the practical part of this thesis, an experiment is implemented. With help of optical interferometer, parameters are measured and their robustness is evaluated. In the conclusion part of this thesis, acquired information are evaluated and resumed.
Workstation for optical interferometry
Blecha, Martin ; Honec, Peter (referee) ; Janáková, Ilona (advisor)
This thesis is specialized on composition of workplace for experiments flowing from optical interferometry. Here are described laboratory exercise servant for demonstration basic principles of interferometry. In more details is described method measurement of height profile objects with method white light interferometry.

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